Characterization

Quantum Efficiency measurement setup, EnliTech
Agilent B1500A Semiconductor Device Analyzer
Van der Pauw Ecopia Hall Measurement System
FOM Loadmaster
Cyclic voltammetry
Shimadzu FT-IR Spectrophotometer
Shimadzu UV-VIS Spectrophotometer
Oriel Research Arc Lamp Housings Solar Simulator
Scanning electron microscope (SEM), with Energy dispersive X-ray analysis
 

Contact

Technological Educational Institute of Crete School of Applied Technology, Electrical Engineering Department

Estavromenos P.B 1939, Heraklion, GR-71 004, Crete, Greece [TEL] +30 2810 37 98 95 [FAX] +30 2810 37 98 44

Send us an email

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