Characterization

 

ARKEO,  All-in-one measurement platform

Composed by a white LED array and a high speed source meter unit in a four wire configuration, ARKEO enables measuring the illumination intensity dependence of open circuit voltage (Voc), dark J-V and Voc decay. An additional external laser source enables Photoluminescence measurements.

Agilent B1500A Semiconductor Device Analyzer

Mainly used for electrical characterization of developed Organic & Perovskite Solar Cells

Enlitech – Quantum Efficiency measurement setup

A highly accurate, fast and highly repeatable measurement system of Quantum Efficiency, Spectral Response, Incident Photon to Converted Electron efficiency (IPCE) for solar cells.

Park XE7 AFM

Includes the Scanning Kelvin Probe Microscopy (SKPM), Dynamic Contact EFM (DC-EFM) and Piezoresponse Force Microscopy (PFM) modes.

FOM Loadmaster

FOM Sourcemeter enables multiple device testing of solar cells, batteries and fuel cells combined with temperature and humidity measurements.

Cyclic voltammetry

Useful for identifying energy levels of materials under research.

Scanning electron microscope with Energy dispersive X-ray analysis

A high-performance, low cost and versatile SEM with resolution reaching 3.0nm and the ability to observe demanding specimens in Low Vacuum.

Shimadzu UV-VIS Spectrophotometer

Used for absorbance measurements. Measures transitions from the ground state to the excited state of the material.

Van der Pauw Ecopia Hall Measurement System

4-probe method for calculating electrical conductivity, mobility & sheet resistance of films under study.

Theta Metrisis – FR Basic

Used to perform reflectance measurements in order to calculate mainly film thicknesses.